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Computing Units/Adders/Adders with-ci with-co adder_ci_co_ETAII

Description:

None

Implementations:

There are: 4 implementations for this unit

adder_ci_co_ETAII

Version: v1

Reference paper:

  • Ardalan Najafi, Moritz Weissbrich, Guillermo Paya Vaya and Alberto Garcia-Ortiz A Fair Comparison of Adders in Stochastic Regime 2017 27th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS) PDF Bibtex

                
    @INPROCEEDINGS{8106990, 
    author={A. {Najafi} and M. {Weissbrich} and G. {Paya-Vaya} and A. {Garcia-Ortiz}}, 
    booktitle={2017 27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)}, 
    title={A fair comparison of adders in stochastic regime}, 
    year={2017}, 
    volume={}, 
    number={}, 
    pages={1-6}, 
    keywords={adders;logic design;low-power electronics;stochastic processes;error tolerant adder type II;power-efficient systems;approximate circuits;stochastic techniques;approximate arithmetic units;arithmetic circuits;adders;Adders;Computer architecture;Stochastic processes;Generators;Delays}, 
    doi={10.1109/PATMOS.2017.8106990}, 
    ISSN={}, 
    month={Sep.},}
                

  • Ning Zhu, Wang Ling Goh, Kiat Seng Yeo An enhanced low-power high-speed Adder For Error-Tolerant application 2009 Proceedings of the 12th International Symposium on Integrated Circuits PDF Bibtex

                
    @INPROCEEDINGS{5403865, 
    author={ {Ning Zhu} and W. L. {Goh} and K. S. {Yeo}}, 
    booktitle={Proceedings of the 2009 12th International Symposium on Integrated Circuits}, 
    title={An enhanced low-power high-speed Adder For Error-Tolerant application}, 
    year={2009}, 
    volume={}, 
    number={}, 
    pages={69-72}, 
    keywords={adders;integrated circuit design;VLSI;enhanced low-power high-speed adder;VLSI technology;test-error-tolerance;error-tolerant adder;power consumption;power delay product;Adders;Very large scale integration;Digital systems;Integrated circuit noise;Energy consumption;Power engineering and energy;Electronic mail;Degradation;Circuit testing;High speed integrated circuits;Adders;error-tolerance;high speed integrated circuits;low power design}, 
    doi={}, 
    ISSN={2325-0631}, 
    month={Dec},}
                

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